Displaying items by tag: YSZ
YSZ Single Crystal Wafer (111) 1" dia x 0.5 mm, 1SP
- Single crystal: YSZ
- Size: 1" dia. x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 1"x1"x0.5mm, 2SP
- Single crystal: YSZ
- Size: 1" x 1" x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: two sides polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 1"x1"x0.5mm, 1SP
- Single crystal: YSZ
- Size: 1" x 1" x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 8 mm dia x 0.5 mm, 2SP
- Single crystal: YSZ
- Size: 8 mm dia. x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: two sides polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 0.5"x0.5"x0.5mm, 1SP
- Single crystal: YSZ
- Size: 0.5" x 0.5" x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 10x10x1.0mm, 1SP
- Single crystal: YSZ
- Size: 10 x10 x 1.0 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 10x10x0.5mm, 2SP
- Single crystal: YSZ
- Size: 10x10 x 0.5mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: two sides polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 10x10x0.5mm, 1SP
- Single crystal: YSZ
- Size: 10 x 10 x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (111) 5x5x0.5mm, 1SP
- Single crystal: YSZ
- Size: 5 x 5 x 0.5 mm +/-0.05 mm
- Orientation: (111) +/-0.5 Deg
- Polish: one side polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
YSZ (110) 5x5x0.5mm, 2SP
- Single crystal: YSZ
- Size: 5 x 5 x 0.5 mm +/-0.05 mm
- Orientation: (110) +/-0.5 Deg
- Polish: two sides polished, polished by CMP technology
- Surface roughness: < 5A RMS by AFM
Typical Properties
Chemical Formula |
Y2O3 stabilized ZrO2, 8 % mole Y2O3 |
Crystal Structure |
Cubic, Face Centered, CaF2 type |
Unit Cell |
a = 5.125 A |
Density |
5.8 g / cc |
Melting Point |
2500 oC |
Thermal Expansion Coeff. |
10.3 ppm / oC |
Dielectric Constant |
27 |
Crystal Growth Technique |
Flux Technique |
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